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NEWS TAGGED METROLOGY
Wednesday 13 May 2009
KLA-Tencor and Tokyo Electron introduce new software tool to measure 3D logic and memory structures
KLA-Tencor today (May 13) launched the AcuShape 3D software modeling tool, developed with Tokyo Electron, to meet optical dimension metrology requirements for the 32nm node and bel...
Tuesday 12 May 2009
Consolidation still rampant in semiconductor metrology/inspection equipment market, says The Information Network
The semiconductor metrology/inspection equipment (MIE) market finally outperformed the rest of the overall semiconductor front-end wafer processing equipment market for the first...
Wednesday 22 April 2009
Equipment supplier Metryx receives follow-on order from key GaAs maker
Metryx, a UK-based semiconductor equipment manufacturer specializing in unique nanotechnology mass measurement techniques, recently announced that it has shipped its second Mentor...
Thursday 16 April 2009
TSMC adopts Jordan Valley JVX 6200 for copper layer metrology
Jordan Valley Semiconductors, a provider of semiconductor metrology solutions, recently announced that Taiwan Semiconductor Manufacturing Company (TSMC) has selected its JVX 6200...
Tuesday 15 July 2008
Opportunity and challenge in China semi inspection and metrology market: Q&A with KLA-Tencor China president Su Hua
With China being one of the key hubs for semiconductor production and key market for semiconductor sales, leading process control and yield management tool supplier KLA-Tencor believes...