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NEWS TAGGED METROLOGY
Friday 18 June 2021
Applied Materials breakthrough in chip wiring enables logic scaling to 3nm and beyond
Applied Materials has unveiled a new way to engineer the wiring of advanced logic chips that enables scaling to the 3nm node and beyond.
Tuesday 30 March 2021
IC equipment vendor KLA to boost local team in Taiwan
US-based semiconductor equipment vendor KLA is looking to beef up its operations in Taiwan with plans to hire an additional 100 staff this year.
Monday 2 March 2020
KLA intros new IC metrology systems
KLA has announced the Archer 750 imaging-based overlay metrology system and the SpectraShape 11k optical critical dimension (CD) metrology system for IC manufacturing.
Tuesday 12 February 2019
Chroma to buy 20.5% of Camtek
Camtek has announced that Chroma Ate, a Taiwan-based high precision test and measurement equipment provider, has entered into a definitive agreement to acquire approximately 20.5%...
Wednesday 12 September 2018
KLA-Tencor seeing robust fab tool demand from China
Demand from China's semiconductor industry is set to witness robust growth, according to fab toolmaker KLA-Tencor, which expects China to become its largest market in 2019.
Friday 20 October 2017
ASML 3Q17 sales exceed guidance on extra EUV deliveries
ASML has announced net sales of EUR 2.45 billion (US$2.89 billion) for the third quarter of 2017, up 16.5% from EUR2.1 billion in the prior quarter. The Dutch fab tool vendor now...
Wednesday 13 September 2017
SEMICON Taiwan 2017: KLA-Tencor showcasing reticle blank inspection tools
At the ongoing SEMICON Taiwan 2017, KLA-Tencor is showcasing its new FlashScan reticle blank inspection product line which represents the company's entry into the dedicated reticle...
Tuesday 13 November 2012
Maxim smart-meter SoC combines metrology, security, and communication
Maxim Integrated Products recently introduced Zeus, an advance in integration and security protection for the smart grid. Zeus is a complete smart-meter system-on-a-chip (SoC) that...
Friday 15 October 2010
Taiwan to announce testing standard for AC LEDs
Taiwan's Bureau of Standards, Metrology and Inspection under the Ministry of Economic Affairs (MOEA) is expected to announce standards for AC LED component and module testing at the...
Wednesday 13 May 2009
KLA-Tencor and Tokyo Electron introduce new software tool to measure 3D logic and memory structures
KLA-Tencor today (May 13) launched the AcuShape 3D software modeling tool, developed with Tokyo Electron, to meet optical dimension metrology requirements for the 32nm node and bel...
Tuesday 12 May 2009
Consolidation still rampant in semiconductor metrology/inspection equipment market, says The Information Network
The semiconductor metrology/inspection equipment (MIE) market finally outperformed the rest of the overall semiconductor front-end wafer processing equipment market for the first...
Wednesday 22 April 2009
Equipment supplier Metryx receives follow-on order from key GaAs maker
Metryx, a UK-based semiconductor equipment manufacturer specializing in unique nanotechnology mass measurement techniques, recently announced that it has shipped its second Mentor...
Thursday 16 April 2009
TSMC adopts Jordan Valley JVX 6200 for copper layer metrology
Jordan Valley Semiconductors, a provider of semiconductor metrology solutions, recently announced that Taiwan Semiconductor Manufacturing Company (TSMC) has selected its JVX 6200...
Tuesday 15 July 2008
Opportunity and challenge in China semi inspection and metrology market: Q&A with KLA-Tencor China president Su Hua
With China being one of the key hubs for semiconductor production and key market for semiconductor sales, leading process control and yield management tool supplier KLA-Tencor believes...