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Wednesday 21 June 2023
STAr Technologies and Korea Conformity Laboratories sign MoU for semiconductor reliability test
STAr Technologies, Inc. ("STAr" for short), a well-known semiconductor test solutions supplier, and Korea Conformity Laboratories ("KCL" for short), a leading testing and certification...
Wednesday 14 June 2023
STAr Technologies opens Phoenix AZ probe card application service center
STAr Technologies, a leading test system and probe card supplier to semiconductor industry, today announced the opening of a new probe card demo and potential test services center...
Tuesday 11 April 2023
STAr Technologies unveils 3D/2.5D MEMS micro-cantilever WAT probe card
STAr Technologies, a leading manufacturer of semiconductor test probe cards, unveiled the new 3D/2.5D MEMS micro-cantilever probe card for WAT reliability testing. The Virgo-Prima...
Tuesday 27 December 2022
STAr Technologies announces PoWoS trademark registration
STAr Technologies, a leading semiconductor test probe card manufacturer, is pleased to announce that its trademark application for "PoWoS," Probe-on-Wafer-on-Substrate, has been approved...
Tuesday 26 July 2022
STAr Technologies releases new test software for advanced wafer-level reliability qualification
STAr Technologies, a provider of semiconductor test solutions, releases a new Sagittarius-WLR integrated platform for advanced Wafer-Level Reliability (WLR) tests. Sagittarius-WLR...
Wednesday 13 July 2022
STAr Technologies announces sale of Accel-RF HTOL Burn-In systems to top Taiwan semiconductor foundries
STAr Technologies, a leading supplier of semiconductor reliability test systems, today announces the sale of Accel-RF HTOL Burn-In test systems to top semiconductor foundries in Taiwan...
Thursday 19 May 2022
STAr Technologies unveils one-touch memory test probe card
STAr Technologies, a leading supplier of semiconductor test probe cards, unveils a new one-touch Aries-Prima Memory Test probe card. The probe card is designed specifically to meet...
Thursday 24 March 2022
STAr Technologies completes order for all-in-one dynamic high current & voltage reliability test system
STAr Technologies, a leading supplier of semiconductor reliability test systems, announced the shipment of the all-in-one SMU-per-pin test system, the STAr Pluto-hiVIP, to benchmark...
Wednesday 2 June 2021
STAr Technologies delivers world first fine-pitch high-current MEMS vertical probe card for high-volume manufacturing
STAr Technologies, a leading supplier of semiconductor test systems and probe cards, announces the immediate availability of the Aries-Optima MEMS probe card, the world's first fine-pitch...
Friday 25 September 2020
STAr Technologies launches next generation all-in-one per-pin SMU reliability test system
STAr Technologies, a leader in parametric and reliability test systems today has launched STAr Pluto series tester to meet test needs for both Package- and Wafer-level reliability...
Monday 31 August 2020
STAr Technologies celebrates 20th anniversary
STAr Technologies, Inc. (the acronym for "Semiconductor Test Architects"), a leading supplier in integrated test systems, WAT/Wafer sort probe cards, and ATE for the semiconductor...