STAr Technologies, a leading supplier of semiconductor reliability test systems, today announces the sale of Accel-RF HTOL Burn-In test systems to top semiconductor foundries in Taiwan. Accel-RF Instruments Corp., a STAr Technologies Group company, located in San Diego, U.S.A. and specializing in turn-key RF reliability and performance characterization test solutions for compound semiconductors, provides this HTOL burn-in reliability test solution.
With industries driving increased complexity in RF systems, more components and devices are becoming part of the RF block diagram. To ensure complete system reliability, the qualification of critical components subject to high RF drive when in use is needed. Accel-RF, the world leader in the design and manufacture of RF reliability test systems, designed the RF-Biased Burn-In system with modular architecture and a high channel-capacity, expandable tray design, to provide the flexibility to qualify multiple device types within a small rack footprint. The system boasts a range of DC bias supply options, from high resolution/low power supplies for small devices including GaAs HBT and SiGe, to options for high power RF devices including GaN and LDMOS, etc.
The RF-Biased HTOL Burn-In system configuration has all power supply control units and PCU modules embedded and controlled through the LIFETEST software and system controller. Auto-Bias features for gate/base and drain/collector levels, and on/off sequencing are programmable in the PCU setup. Each channel or DUT is independently sourced and controlled in this platform architecture. All temperature setting and control are achieved through the LIFETEST software and temperature monitoring is done independently and individually per DUT channel.
"The RF-Bias Burn-In reliability system addresses growing industry test requirements and enables manufacturers to collect the reliability data their customers demand, ensuring early adoption of their devices to the marketplace," Roland Shaw, president of Accel-RF commented. "The sale of our RF reliability systems to Taiwan's top foundries reflects our ability to stay on the cutting edge of semiconductor test technology, and shows that we have been recognized by the global semiconductor industry."
Yu-Ming Chien, President of STAr Technologies test business group said, "Innovation is at the core of our corporate philosophy. The RF-Biased Burn-In reliability system diversifies and enhances our range of products, solutions and services. STAr Technologies will continue being committed to providing effective solutions to meet customers' test needs now and in the future."