As demand for AI servers, high performance computing (HPC), and data center infrastructure accelerates, the semiconductor and power electronics test equipment market is experiencing strong growth. This momentum is expected to continue as advanced semiconductor technologies drive increasingly sophisticated testing requirements.
Chroma ATE Inc., a company with more than two decades of experience in automated test equipment (ATE), recently held its Semiconductor Test Equipment User Conference in Hsinchu, Taiwan. Registration quickly reached capacity, reflecting the company's growing prominence in the semiconductor testing market. In 2025, Chroma reported consolidated revenue of US$943 million and grew its global workforce to nearly 4,000 employees.
Credit: Chroma
George Chang, President of Chroma's Semiconductor Test Equipment Business Unit (STE BU), emphasized that Chroma is one of the few ATE suppliers with the in-house capability to develop application-specific integrated circuits (ASICs) for its own test systems. This capability creates a "technology moat" that reinforces Chroma's competitive advantage.
To address the diverse needs of the semiconductor testing market, Chroma has built its portfolio around three specialized test platforms. The Chroma 3680 is designed for advanced devices used in AI, HPC, microcontroller unit (MCU), and mixed-signal applications, the Chroma 3650 addresses power devices and systems-on-chip (SoCs), and the Chroma 3380 targets mainstream MCUs, Internet of Things (IoT) devices, and other chips manufactured on mature process nodes. Combined shipments across the three platforms have exceeded 4,000 systems. This year, Chroma also introduced the compact Chroma 3650-S2C platform for high-power devices, responding to increasingly rapid product cycles across the semiconductor industry.
Proprietary PINF ASIC Enables Seamless Migration for Complex SoC Testing
As AI and HPC drive more complicated chip designs, testing is becoming more diverse and technically more demanding. At the same time, the industry is facing growing pressure to reduce costs and shorter test development schedules.
Spancer Lee, Senior Manager of product marketing at Chroma's STE BU, explained that the Chroma 3680 integrates Chroma's next-generation, self-developed PINF ASIC with a range of specialized system boards, each supporting different test functions. This architecture enables comprehensive coverage across four major testing domains: digital, analog, mixed-signal, and RF devices. Chroma plans to continue expanding the platform's capabilities, leveraging the flexibility of its in-house hardware development to support high-precision testing of increasingly complex and high-frequency SoC devices.
To accommodate the intensive data transfer and processing requirements involved with testing advanced semiconductor devices, the Chroma 3680 employs an 8-lane, 20 Gbps parallel high-speed data architecture. Optimized firmware enables high-speed transfer and more efficient processing of complex test data. The architecture also minimizes synchronization latency between digital and analog resources, improving resource integration for highly complex SoC test programs.
The Chroma 3680 architecture is also compatible with certain probe card models used on competitor platforms. This allows customers to retain existing load boards and test programs without modifying their hardware, reducing migration costs while maximizing ROI and helping chipmakers gain a competitive edge in the market.
Credit: Chroma
Chroma 3650-S2C Delivers High-Voltage Capability in a Compact Footprint
With NVIDIA signaling a transition toward direct 800V DC power delivery for server racks, semiconductor manufacturers face growing demand for high-voltage testing.
To address this need, Chroma developed the 3650-S2C, a new test platform optimized for high-power semiconductor devices including silicon carbide (SiC) and gallium nitride (GaN). Through extensive engineering refinement, the platform's slot count was reduced to six, optimized for the requirements of intermediate-level testing. Chroma also substantially streamlined the external high-voltage power rack by integrating it directly into the test head.
The 3650-S2C cuts the system footprint by half, enabling seamless integration with mainstream turret handlers for volume production while helping OSAT partners save valuable factory space and infrastructure costs.
Aaron Chuang, Senior Manager of Advanced Technology Development at Chroma's STE BU, highlighted two key characteristics of the Chroma 3650-S2C: powerful high-voltage capability and a compact footprint. Building on the proven Chroma 3650-S2 platform, the solution integrates a high-voltage source-measurement unit (HVSMU) board to deliver a comprehensive, one-stop solution for five critical test parameters. It enables customers to safely and accurately overcome the 4 kV test threshold while maintaining production throughput, providing a powerful foundation for next-generation high-voltage power semiconductors to advance into mass production.
Credit: Chroma
Integrated High-Density RF Technology Addresses Next-Generation Ultra-High-Frequency Wireless Testing
The rapid adoption of AI, edge computing, and intelligent connected devices continues to drive growth across Wi-Fi, Bluetooth, GNSS, IoT, mobile, and wearable applications. At the same time, wireless communication chipsets are undergoing a significant generational upgrade.
To address these evolving requirements, Chroma has integrated its new HDRF3 (high-density radio frequency) test module into the Chroma 3680 platform. The solution is designed to support the increasing bandwidth, advanced modulation schemes, and multi-antenna architectures required by next-generation wireless technologies. This positions the company to capture the high-performance networking and AIoT chip packaging and testing markets.
According to Jackson Hsu, associate director of application engineering at ADIVIC, a Chroma-affiliated company, Wi-Fi 7 expands channel bandwidth from 160 MHz to 320 MHz while increasing modulation density to 4096-QAM. These advances place exacting demands on RF performance and noise characteristics in test instrumentation. The HDRF3 test module was specifically developed to meet these requirements, extending operating frequencies up to 8 GHz and providing full coverage for Wi-Fi 7 as well as future Wi-Fi 8 implementations.
ADIVIC also plans to launch an extension model, the 35809, featuring a simplified 16-port design while maintaining complete software compatibility with the production-oriented HDRF3 platform. The solution is targeted at applications requiring RF IC testing only.
Chroma's in-house ASIC expertise allows the company to adapt the hardware architecture of its Chroma 3680, 3650, and 3380 platforms to distinct market requirements. From the space-efficient Chroma 3650-S2C to the high-density HDRF3 module, each development addresses emerging technical challenges across the semiconductor industry.
Credit: Chroma
Through a combination of flexibility, high return on investment, and seamless platform migration strategies, Chroma helps customers accelerate adoption while reducing operational barriers. As AI, advanced computing, wireless connectivity, and power semiconductors continue to reshape the industry, Chroma is positioning itself as a long-term strategic partner for the world's leading semiconductor manufacturers.
