DesignCon, the United States' premier annual gathering for chip, board, and systems design engineers, returns to the Santa Clara Convention Center from February 24-26, 2026. For over three decades, this flagship Silicon Valley event has served as the essential forum for industry professionals to discover innovative solutions to the most pressing signal and power integrity challenges.
As a global leader in semiconductor test sockets, Smiths Interconnect is proud to announce its participation in this prestigious conference and exhibition. We will feature a comprehensive portfolio of our star test products, highlighting solutions engineered for the next generation of technology in AI PCs, Enterprise Data Centres (EDC), automotive electronics, and the Internet of Things (IoT).
Spotlight on Innovation: DaVinci Gen V High-Speed Test Socket
Headlining the display will be the DaVinci Gen V High-Speed Test Socket, Smiths Interconnect's latest flagship product. Designed to meet the extreme demands of high-performance computing and AI data centres, the DaVinci Gen V test socket delivers breakthrough high-speed signal transmission and performance. It enables unprecedented digital signaling speeds of up to 224 Gbps PAM4 for AI accelerators and beyond 100 GHz for 6G communications. These speeds are crucial for supporting the growing demand for massive data transfer.
The solution supports BGA, LGA, and other package variants, using spring probe technology with a homogeneous alloy and gold plating to ensure better grounding. It delivers RF bandwidth greater than 84 GHz at -1 dB insertion loss, with a short signal path and a 4.90 mm test height. The impedance is tuned to match the system, providing consistent and stable contact resistance of 55 mΩ on average.
The design also accommodates high co-planarity and features a tri-temp socket structure capable of operating from -55 °C to +150 °C. The same socket is suitable for manual test, bench test, and high-volume manufacturing (HVM) production test, enabling greater efficiency and consistency across test stages.
In addition to high-speed test solutions, Smiths Interconnect will also showcase its high-power burn-in socket, a specialised electromechanical interface designed to temporarily connect a semiconductor device—such as a CPU, GPU, AI accelerator, or high-power discrete component—to a test board during the burn-in and stress-testing phase of manufacturing.
It is designed to support next-generation devices with up to 22,000 contacts and sizes up to 150 × 150 mm, while managing power levels of up to 2000 W through integrated liquid cooling. The socket is universally compatible with advanced burn-in chamber platforms and can deliver a 500 lb applied load with a maximum closing force of 15 lb. Flexible thermal options, including passive heatsinks and heat pipes, are also available to meet different testing requirements.
This burn-in socket is built for durability and thermal/electrical stability under extreme stress conditions.
Attendees are invited to visit Booth 508 to experience Smiths Interconnect's cutting-edge technologies firsthand and engage with technical experts.
Credit: Smiths Interconnect
Credit: Smiths Interconnect
