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STAr Technologies completes order for all-in-one dynamic high current & voltage reliability test system

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STAr Pluto-hiVIP System. Credit: STAr

STAr Technologies, a leading supplier of semiconductor reliability test systems, announced the shipment of the all-in-one SMU-per-pin test system, the STAr Pluto-hiVIP, to benchmark the semiconductor test reliability system industry. The system is configured for low/high current dynamic AC electromigration and burn-in testing for high pin count devices such as TSV, copper-pillar, micro-bump, etc. and also high voltage, high power HCI & NBTI HCI/NBTI & high voltage GOI reliability tests.

The STAr Pluto Series system is the next generation reliability test solutions for both package-level and wafer-level qualification and supports a wide range of configurations to meet industry testing requirements for EM, HCI, NBTI, TDDB, etc. The new STAr Pluto-hiVIP model of the Pluto Series is an advanced high-current & high-voltage test system with flexible architecture that can be easily upgraded to a high-capacity system to support multiple applications within one system.

The maximum configuration comprises 48 Source-Measurement Unit (SMU) modules, each with dual independent sources. A total of 96 sources allows high DUT count to achieve greater qualification test performance and significantly increases the capacity for high-current and high-voltage reliability tests.

STAr Pluto hiVIP is a complete, integrated package-level and high temperature reliability test solution designed to support high-current EM, high-power HCI/BTI and high-voltage TDDB qualification. The system is designed for parallel stressing and testing, supporting up to a max of 4.0A DC, and high breakdown voltage of up to 100V. With thermal chambers ranging from 18C to 400C, with DUT board equipped with zero-insertion-force sockets ensures complete set of environments suitable for the full suite of reliability tests from room temperature HCI to high temperature EM tests within a single system. Pluto hiVIP system is ensured to main high precision test result and qualification performance.

"This shipment validates the STAr Pluto family extraordinary capabilities, efficiency and test accuracy recognized by industry customers. The Pluto Series system is based on new hardware and software architecture to address today and future's semiconductor qualification test requirements and reduces engineering efforts to support customers achieve the best test performance and higher capacity," said ChoonLeong Lou, CEO & CTO of STAr Technologies.

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