More non-visual defects highlight necessity for advanced wafer inspection tools, says Qcept

Ingrid Lee, Taipei; Esther Lam, DIGITIMES Asia Thursday 13 March 2008 0

In light of the rising challenges due to the increase in non-visual defects as processing nodes advance, Qcept Technologies believes it is necessary for wafer makers to utilize more advanced inspection tools. As a result, the wafer inspection system...

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