STAr Technologies, a leading semiconductor test probe card manufacturer, is pleased to announce that its trademark application for "PoWoS," Probe-on-Wafer-on-Substrate, has been approved by Taiwan Intellectual Property Office (TIPO), and the registration process is completed. The trademark covers the following product and service category: "Probe, test probe card, IC tester, mixed IC tester, IC tester manufacture/service, development of test software, and test consultant services, etc."
The PoWoS is technology based on multiple pending patents on probe cards, interfaces and tests, that incorporate wafer-level tests of advanced nanometer technology nodes semiconductor ICs. Probe cards are complex system that incorporates many advanced parts that is critical in semiconductor wafer-level tests process required to ensure high stability to achieve accurate test results and with extended lifetime to reduce COT (cost-of-test). STAr Technologies focuses on the interface and assembly technologies which efficiently enhances probe card performances and lower cost-of-ownership. The approval of PoWoS trademark provides essential layer of protection for the future technology developments and applications of STAr's probe cards.
STAr Technologies' trademark of "PoWoS" (Probe-on-Wafer-on-Substrate)
"We are pleased that the Intellectual Property Office has approved our registration application and believe our probe card solution are ideal for industry customers. STAr has placed a value on the intellectual property and been underling the corporate commitment to protect its innovation and technology for future growth," said Dr. Choon-Leong LOU, CEO&CTO of STAr Technologies, Inc.
